Diagnostic SW Test Libraries for achieving SIL2/SIL3
YOGITECH portfolio of diagnostic SW Test Libraries now includes libraries for STM32 MCUs, addressing Cortex-M core, RAM, flash and configuration registers of peripherals, and silicon-vendor-independent libraries targeting only the Cortex-M cores.
YOGITECH fRSTL libraries are an optimized and highly effective SW solution on all safety projects that need to reach SIL2/SIL3 without having to modify the HW.
Thanks to the use of the fRMethodology, the diagnostic coverage is quantitatively verified and reported in the documentation.
Moreover, YOGITECH fRSTL libraries are certified by TÜV Rheinland.

faultRobust technology

The comprehensive technology addressing functional safety according to multiple standards like IEC 61508, ISO 26262, ISO 13849, IEC 62061, IEC 61800-5-2, IEC 60730. Fault robustness is more than functional safety because it aims to combine reliability, availability, security and safety. faultRobust® paradigm is to reach “as much fault tolerance as you need”, i.e. optimizing costs, power and performance impacts of the additional artifacts (safety analyses, safety verification, HW and SW safety mechanisms) needed to fulfill the requirements of functional safety standards with respect to both systematic and HW random failures.