The one stop shop for
The fRSTL_stm32 portfolio provides a simple means to detect and flag potentially dangerous failures in STM32-bit ARM Cortex MCUs. This means system manufacturers have the ability to reach the target safety integrity level with no or limited safety specific HW mechanisms integrated in the components.
The SW test Libraries are developed according to IEC 61508 2nd edition and each Safety Manual describes how they can be integrated in systems targeting other safety-related standards including ISO 13849-1, IEC 62061, IEC 61800-5-2, IEC 60730 and ISO 26262.
The comprehensive technology addressing functional safety according to multiple standards like IEC 61508, ISO 26262, ISO 13849, IEC 62061, IEC 61800-5-2, IEC 60730. Fault robustness is more than functional safety because it aims to
combine reliability, availability, security and safety. faultRobust paradigm is to reach “as much fault tolerance as you need”, i.e. optimizing costs, power and performance impacts of the additional artifacts (safety analyses, safety verification, HW and SW safety mechanisms) needed to fulfill the requirements of functional safety standards with respect to both systematic and HW random failures.